EIA JESD 94B:2015

The method described in this document applies to all application specific reliability testing for solid state device with known failure mechanisms where the test duration and conditions vary based on application variables. This document does not cover reliability tests that are characterization based or essentially go/no-go type tests, for example, ESD, latch-up, or electrical over stress. Also, it does not attempt to cover every failure mechanism or test environment, but does provide a methodology that can be extended to other failure mechanisms and test environments. The purpose of this document is to provide a method for developing an application specific reliability evaluation methodology based on the use conditions the solid state device is expected to experience in the field. It assumes that the failure mechanisms and models, relevant to the product being tested, are a known entity.