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BS EN 60749-25:2003

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BS EN 60749-25:2003

Semiconductor devices. Mechanical and climatic test methods - Temperature cycling

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Author BSI
Editor BSI
Document type Standard
Format File
EAN ISBN 0 580 42859 1
ICS 31.080.01 : Semiconductor devices in general
Number of pages 16
Cross references IEC 60749-25:2003,EN 60749-25:2003,EN 60068-2-30:1999
Year 2003
Country United Kingdom