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BS EN 60749-44:2016
New product
BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods - Neutron beam irradiated single event effect (SEE) test method for semiconductor devicesMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 86203 8 |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 26 |
| Cross references | IEC 60749-44:2016,EN 60749-44:2016 |
| Set | MYSTD-20STD |
| Year | 2016 |
| Country | United Kingdom |
| Keyword | BS EN 60749-44 ; BSEN60749-44 ; BS EN 6074944 ; BS EN 60749:44 ; BSEN 60749 44 ; BS EN60749 44 |