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BS EN 60749-28:2017
New product
BS EN 60749-28:2017
Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device levelMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 53678 6 |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 50 |
| Cross references | IEC 60749-28:2017,EN 60749-28:2017 |
| Set | MYSTD-20STD |
| Year | 2017 |
| Country | UK |