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BS EN 60749-43:2017
New product
BS EN 60749-43:2017
Semiconductor devices - Mechanical and climatic test methods - Guidelines for IC reliability qualification plansMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 80345 1 |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 44 |
| Cross references | IEC 60749-43:2017,EN 60749-43:2017 |
| Set | MYSTD-20STD |
| Year | 2017 |
| Country | UK |