Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Sale!
View larger
View larger
BS EN 60749-4:2017
New product
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods - Damp heat, steady state, highly accelerated stress test (HAST)More info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 94229 7 |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 16 |
| Replace | BS EN 60749-4:2002 |
| Cross references | EN 60749-4:2017,IEC 60749-4:2017 |
| Set | MYSTD-20STD |
| Year | 2017 |
| Country | UK |