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BS CECC 50000:1987
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BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices partTitleEN sectionTitleENMore info
Applies to diodes, transistors, rectifier diodes and thyristors. Specifies quality assessment and test and measurement conditions. Appendices on structural similarity, inspection requirements, tests and screening.
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 0 580 16263 X |
| ICS | 31.080.99 : Other semiconductor devices
|
| Number of pages | 96 |
| Replace | BS 9300:1969 BS CECC 50000:1981 |
| Cross references | CECC 50000:1986 |
| Modified by | AMD 6016 published July 1990 effective July 1990 Free of charge incorporated |
| Year | 1980 |
| Country | United Kingdom |
| Keyword | BS CECC 50000 ; BSCECC50000 ; BSCECC 50000 ; BS CECC50000 |