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General details, quality assessment procedures, test and measurement procedures and a common blank detail specification. To be read in conjunction with BS CECC 90000:1991
Author | BSI |
---|---|
Editor | BSI |
Document type | Standard |
Format | File |
EAN ISBN | 0 580 16472 1 |
ICS | 31.200 : Integrated circuits. Microelectronics
|
Number of pages | 26 |
Replace | BS CECC 90300:1985 |
Cross references | CECC 90300 |
Modified by | AMD 8294 published August 1994 effective August 1994 Free of charge incorporated |
Year | 1980 |
Country | United Kingdom |
Keyword | BS CECC 90300 ; BSCECC90300 ; BSCECC 90300 ; BS CECC90300 |